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022 _a0974-9853
024 7 _a10.1007/12647.0974-9853
_2doi
210 1 0 _aMAPAN
245 1 0 _aMAPAN
_h[electronic resource] :
_bJournal of Metrology Society of India /
_cedited by Shiv Kumar Jaiswal, Sanjay Yadav.
264 1 _aNew Delhi :
_bSpringer India :
_bImprint: Springer.
300 _bonline resource.
520 _aMAPAN – Journal of Metrology Society of India is an international, peer reviewed journal focused on the advancement of measurement science and technology. The journal publishes original research articles, comprehensive reviews, and technical communications addressing both fundamental and applied metrology. It covers a broad range of topics including physical, chemical, biological, industrial, and legal metrology; measurement standards and traceability; calibration methodologies and uncertainty analysis; instrumentation and sensor systems; measurement data processing and analytics; and metrology for emerging areas such as nanotechnology, quantum science, smart manufacturing, environmental monitoring, digital metrology and AI tools in metrology. The journal further encompasses metrology policy, international measurement comparisons (including hybrid and bilateral comparison report’s and Proficiency testing report’s) and capacity-building initiatives, with the objective of fostering innovation, ensuring harmonization of measurement standards, and disseminating best practices to the global metrology community.
650 0 _aMeasurement.
650 0 _aMeasuring instruments.
650 0 _aMathematical physics.
650 0 _aMathematical physics.
650 1 4 _aMeasurement Science and Instrumentation.
650 2 4 _aTheoretical, Mathematical and Computational Physics.
650 2 4 _aMathematical Methods in Physics.
700 1 _aJaiswal, Shiv Kumar.
_eeditor.
_4edt
_4http://id.loc.gov/vocabulary/relators/edt
700 1 _aYadav, Sanjay.
_eeditor.
_4edt
_4http://id.loc.gov/vocabulary/relators/edt
710 2 _aSpringerLink (Online service)
776 0 8 _iPrinted version:
_x0970-3950
856 4 0 _uhttps://doi.org/10.1007/12647.0974-9853
_zHybrid
999 _c1762
_d1762