TY  - SER
AU  - Jaiswal,Shiv Kumar
AU  - Yadav,Sanjay
ED  - SpringerLink (Online service)
TI  - MAPAN: Journal of Metrology Society of India 
SN  - 0974-9853
CY  - New Delhi
PB  - Springer India, Imprint: Springer.
KW  - Measurement
KW  - Measuring instruments
KW  - Mathematical physics
KW  - Measurement Science and Instrumentation
KW  - Theoretical, Mathematical and Computational Physics
KW  - Mathematical Methods in Physics
N2  - MAPAN – Journal of Metrology Society of India is an international, peer reviewed journal focused on the advancement of measurement science and technology. The journal publishes original research articles, comprehensive reviews, and technical communications addressing both fundamental and applied metrology. It covers a broad range of topics including physical, chemical, biological, industrial, and legal metrology; measurement standards and traceability; calibration methodologies and uncertainty analysis; instrumentation and sensor systems; measurement data processing and analytics; and metrology for emerging areas such as nanotechnology, quantum science, smart manufacturing, environmental monitoring, digital metrology and AI tools in metrology. The journal further encompasses metrology policy, international measurement comparisons (including hybrid and bilateral comparison report’s and Proficiency testing report’s) and capacity-building initiatives, with the objective of fostering innovation, ensuring harmonization of measurement standards, and disseminating best practices to the global metrology community
UR  - https://doi.org/10.1007/12647.0974-9853
ER  -