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MAPAN (Record no. 1762)

MARC details
000 -LEADER
fixed length control field 02370nas a22003375i 4500
001 - CONTROL NUMBER
control field 0974-9853
003 - CONTROL NUMBER IDENTIFIER
control field DE-He213
005 - DATE AND TIME OF LATEST TRANSACTION
control field 20260610082454.0
007 - PHYSICAL DESCRIPTION FIXED FIELD--GENERAL INFORMATION
fixed length control field cr nn 008mamaa
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION
fixed length control field 150723s||||||||ii uu poo|||||| b|EN |d
022 ## - INTERNATIONAL STANDARD SERIAL NUMBER
International Standard Serial Number 0974-9853
024 7# - OTHER STANDARD IDENTIFIER
Standard number or code 10.1007/12647.0974-9853
Source of number or code doi
210 10 - ABBREVIATED TITLE
Abbreviated title MAPAN
245 10 - TITLE STATEMENT
Title MAPAN
Medium [electronic resource] :
Remainder of title Journal of Metrology Society of India /
Statement of responsibility, etc. edited by Shiv Kumar Jaiswal, Sanjay Yadav.
264 #1 - PRODUCTION, PUBLICATION, DISTRIBUTION, MANUFACTURE, AND COPYRIGHT NOTICE
Place of production, publication, distribution, manufacture New Delhi :
Name of producer, publisher, distributor, manufacturer Springer India :
-- Imprint: Springer.
300 ## - online resource
Other physical details online resource.
520 ## - SUMMARY, ETC.
Summary, etc. MAPAN – Journal of Metrology Society of India is an international, peer reviewed journal focused on the advancement of measurement science and technology. The journal publishes original research articles, comprehensive reviews, and technical communications addressing both fundamental and applied metrology. It covers a broad range of topics including physical, chemical, biological, industrial, and legal metrology; measurement standards and traceability; calibration methodologies and uncertainty analysis; instrumentation and sensor systems; measurement data processing and analytics; and metrology for emerging areas such as nanotechnology, quantum science, smart manufacturing, environmental monitoring, digital metrology and AI tools in metrology. The journal further encompasses metrology policy, international measurement comparisons (including hybrid and bilateral comparison report’s and Proficiency testing report’s) and capacity-building initiatives, with the objective of fostering innovation, ensuring harmonization of measurement standards, and disseminating best practices to the global metrology community.
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Measurement.
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Measuring instruments.
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Mathematical physics.
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Mathematical physics.
650 14 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Measurement Science and Instrumentation.
650 24 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Theoretical, Mathematical and Computational Physics.
650 24 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Mathematical Methods in Physics.
700 1# - ADDED ENTRY--PERSONAL NAME
Personal name Jaiswal, Shiv Kumar.
Relator term editor.
Relationship edt
-- http://id.loc.gov/vocabulary/relators/edt
700 1# - ADDED ENTRY--PERSONAL NAME
Personal name Yadav, Sanjay.
Relator term editor.
Relationship edt
-- http://id.loc.gov/vocabulary/relators/edt
710 2# - ADDED ENTRY--CORPORATE NAME
Corporate name or jurisdiction name as entry element SpringerLink (Online service)
776 08 - ADDITIONAL PHYSICAL FORM ENTRY
Relationship information Printed version:
International Standard Serial Number 0970-3950
856 40 - ELECTRONIC LOCATION AND ACCESS
Uniform Resource Identifier <a href="https://doi.org/10.1007/12647.0974-9853">https://doi.org/10.1007/12647.0974-9853</a>
Public note Hybrid

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