Optoelectronics, Instrumentation and Data Processing is a peer-reviewed journal that focuses on the following areas: analysis and synthesis of signals and images; automated measurement systems; computational and information-measuring systems; physical and technical foundations of micro- and optoelectronics; optical information technologies; modeling in physical and technical research; and nanotechnologies in optics and electronics. The journal reports findings in several growing areas of physical and computer research. From its inception, it has covered the design and development of instrumentation and systems for automatic measurement. Its scope has broadened to include automation based on laser and optoelectronic technologies, laser and nonlinear optics, new information technologies, and problem-oriented computer systems. The journal timely presents the results of basic and applied research on solid-state physics, optics, and holography in applications to computers and measurement techniques; physical aspects of micro- and optoelectronics; optical information technologies, systems and components; laser physics applications; automated measurement systems; automation of scientific R&D and industrial automation; real-time image analysis and synthesis systems; AI methods and systems in scientific research and management; computer networks and data transmission systems; computer-aided VLSI design, and other topics. The journal has the aim to become an international publication and publishes manuscripts originally submitted in English from all countries along with translated works. The peer review policy of the journal is independent of the manuscript source, ensuring a fair and unbiased evaluation process for all submissions.